Function: 300 kV transmission electron microscope with scanning transmission EM (STEM) capabilities.
Features: Our JEOL JEM 3200FS transmission electron microscope (TEM) is an intermediate voltage (300 kV) electron microscope similar to the one shown in this image from the JEOL USA website. This electron microscope uses a thermal field emission gun (FEG) as its electron source, providing an extremely bright and coherent beam of electrons for use in imaging and analysis. The 3200FS installed in Simon Hall during the last half of 2008 is equipped with an in-column energy filter and a Gatan UltraScan 4000 CCD camera. Note that the 3200FS is a different instrument from the JEOL JEM 3200FSC, which is the liquid helium cooled 300 kV TEM found in cryoEM facilities such the New York Structural Biology Center (NYSBC) and the National Center for Macromolecular Imaging (NCMI). In addition to the TEM capabilities of the 3200FS, our instrument is also equipped with scan coils and detectors that allow it to function as a scanning transmission electron microscope (STEM). The dual capabilities of TEM and STEM.
