Function: The JEOL NEOARM is a 200 kilo-volt (kV) electron microscope capable of both transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM). Electron microscopes with such dual imaging capabilities are often designated as (S)TEM instruments. This instrument is mostly intended for the material science applications often referred to as analytical electron microscopy (AEM). The ASCOR spherical aberration corrector allows for consistent atomic resolution STEM imaging which can be coupled to electron energy loss spectroscopy (EELS) and energy dispersive X-ray spectroscopy (EDXS or EDS). Additional detectors and software tools allow for an extensive range of AEM techniques.
Features: The main camera of the NEOARM is a 4k x 4k Gatan OneView. It has multiple STEM detectors for both bright field and dark field STEM and a Gatan Continuum energy filter for both EELS and EFTEM. Dual EDXS detectors allow for atomic resolution STEM/EDXS mapping (elemental mapping). The IDES Synchrony Electrostatic Dose Modulator system allows for precise electron dose control during both TEM and STEM imaging, allowing imaging and analysis of electron beam sensitive materials. Additional software allows for techniques such as TEM and STEM tomography and various in situ workflows.
