TA Instruments SDT 650 Simultaneous Thermal Analyzer (DSC/TGA) System
Model: TA Instruments SDT 650
Description: TA Instruments SDT 650 combines Differential Scanning Calorimetry (DSC) and Thermogravimetric Analysis (TGA) in a single system
Function: This SDT (DSC/TGA) instrument is for comprehensive thermal characterization. It measures heat flow and weight change simultaneously, enabling analysis of phase transitions, melting points, glass transitions, and thermal stability. This system is ideal for studying polymers, composites, nanomaterials, and pharmaceuticals. With precise temperature control and high sensitivity, it provides insights into decomposition, oxidation, and material compatibility. The SDT 650 supports research in materials science and engineering by delivering accurate thermal and compositional data for advanced material development.
Features: 1) Provides simultaneous measurement of TGA & DSC from ambient to 1,500 ˚C. 2) Features a field-proven horizontal dual beam design with automatic beam growth compensation, and the ability to analyze two TGA samples simultaneously. 3) Horizontal dual-beam design for superior heat flow and weight measurements. 4) Dual-sample TGA mode for double the productivity of competitive systems. 5) Ultra-low drift balance design for unrivaled performance in baseline flatness, sensitivity, and resolution. 6) Modulated DSC®,(MDSC®), for the best determination of heat capacity. 7) Hi-Res™ TGA for the best separation of overlapping weight losses. 8) Modulated TGA™,(MTGA™), for increased productivity for studying kinetics. 8) Reliable linear autosampler with programmable tray positions for worry-free 24/7 operation, most flexible programming of experiments, and automated calibration and verification routines.
Contact:
- Unit: Integrated Nanosystems Development Institute
- Campus: Indianapolis
- Resource Type: Equipment
- Contact Name: Dipak Maity
- Contact Email: maityd@iu.edu
Return to Search
