4-ProbeStation (electrical Characterization) with - Keithley 4200 IV and CV Measurement System
Model: Keithley 4200 IV
Description: Integrated electrical characterization platform for accurate measurement of semiconductor and material electrical properties.
Function: Current–voltage (I–V) measurements; capacitance–voltage (C–V) measurements; material and device characterization.
Features: Four-point probe configuration to minimize contact resistance; low-noise precision sourcing and measurement; programmable voltage/current sweeps; advanced parameter extraction and analysis software.
Contact:
- Unit: Integrated Nanosystems Development Institute
- Campus: Indianapolis
- Resource Type: Equipment
- Contact Name: Dipak Maity
- Contact Email: maityd@iu.edu
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