Bruker IconIR - Atomic Force Microscope (AFM-IR)
Model: Bruker IconIR
Description: Bruker IconIR - Atomic Force Microscope with Infrared Spectroscopy
Function:This AFM-IR equipment for nanoscale chemical and structural characterization. It enables high-resolution imaging of surface topography while simultaneously providing localized infrared absorption spectra, allowing identification of chemical composition at the nanometer scale. This system is ideal for analyzing polymers, composites, thin films, and biological samples. With advanced capabilities like PeakForce Tapping and photothermal IR detection, it supports research in nanotechnology, materials science, and life sciences by delivering precise mechanical, thermal, and chemical property mapping in a single instrument.
Features: "1) High-performance nanoIR spectroscopy with FT-IR correlation, <10 nm chemical resolution, and monolayer sensitivity. 2) Correlative chemical imaging with PeakForce Tapping nanomechanical and nanoelectrical modes. 3) Highest Performance AFM imaging and ultimate sample flexibility. 4) The broadest range of applications accessories and AFM modes High-quality resonance-enhanced AFM-IR"
Contact:
- Unit: Integrated Nanosystems Development Institute
- Campus: Indianapolis
- Resource Type: Equipment
- Contact Name: Dipak Maity
- Contact Email: maityd@iu.edu
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