BRUKER DektakXT Profilometer
Model: BRUKER DektakXT
Description:It is a high-precision surface characterization tool that uses stylus-based contact measurement to analyze step height, roughness, and thin-film thickness. It offers advanced 3D mapping, automated sample alignment, and intuitive software, making it ideal for research, quality control, and semiconductor applications requiring accurate topography analysis.
Function:It functions to measure surface topography and film thickness with high precision. It uses stylus-based contact profiling to capture step height, roughness, and 3D surface mapping, enabling accurate characterization of thin films, coatings, and substrates for research, quality control, and semiconductor applications.
Features: It include stylus-based contact measurement for high-resolution surface profiling, advanced 3D mapping capabilities, automated sample alignment, wide vertical range for step height analysis, intuitive software for data visualization, and compatibility with diverse materials, ensuring precise characterization of thin films, coatings, and substrates.
Contact:
- Unit: Integrated Nanosystems Development Institute
- Campus: Indianapolis
- Resource Type: Equipment
- Contact Name: Dipak Maity
- Contact Email: maityd@iu.edu
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