Bruker D8 Discover X-ray Diffraction (XRD) System
Model: Bruker D8 Discover
Description: Bruker D8 Discover X-ray Diffraction System with 1D and 2D Detectors and a Temperature-controlled Stage (900 C).
Function: This XRD equipment enables advanced characterization of crystalline materials. It provides phase identification, lattice parameter determination, and residual stress analysis. The system supports thin-film studies through grazing incidence and reciprocal space mapping, as well as texture and orientation measurements for polycrystalline samples. Equipped with high-resolution optics and 2D detectors, it delivers precise, non-destructive analysis for metals, ceramics, polymers, and nanostructures, facilitating research in materials science, nanotechnology, and engineering applications.
Features: Includes, 2D, 1D, and OD detectors to allow the analysis of powders, liquids, and thin films. It has also the ability to perform small angle-x-ray scattering. This equipment also includes a heated/cool stage particularly important to researchers working on new nanomaterial substrates and composites. The instrument also features a battery tester, which is of importance to many in engineering. Nevertheless, it includes a laser video system for precise alignment, & air-cooled source, and software that allows full automation and the ability to create a store user “recipes” to expedite training and use.
Contact:
- Unit: Integrated Nanosystems Development Institute
- Campus: Indianapolis
- Resource Type: Equipment
- Contact Name: Dipak Maity
- Contact Email: maityd@iu.edu
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